Microscope Lamps and Accessories
Electron Microscopy Sciences SEM Hitachi S-450 M4 Mount Plain Surface 5/8",1/4" height, Carbon
Hitachi S-450 SEM mounts with M4 tapered hole and female thread. Made from spectroscopically pure carbon.
Head: 5/8"
Height: 1/4"
Electron Microscopy Sciences JEOL ISI SEM Cylinder Mount 5/8" surface, 3/8" height, Carbon
Cylinder specimen mounts are for use with JEOL and ISI scanning electron microscopes. The mounts are made from spectroscopically pure carbon.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences SEM Mount Hitachi S-500 Mount Hitachi S-500, 25 mm, Aluminum
Hitachi S-500 threaded pin SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 1/4"
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 1/2" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 1/2"
Electron Microscopy Sciences Veco Square Mesh Handle 150 mesh Nickel Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Nickel
Pitch: 167 µm
Hole: 117 µm
Bar: 50 µm
Electron Microscopy Sciences Embra Special Shape Grid Z1600, Copper
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Material: Copper
Size: inner:1600 µm, outer 1900 µm, width 150 µm
Electron Microscopy Sciences Eyepiece Scale NE45, 19mm
Full protractor scale is 10 mm in diameter and divided in degrees. Surface chrome image.
Size: 19 mm
Electron Microscopy Sciences Micrometer Dual Extension
Accessory for lapping and polishing machine. Micrometer Dual Extension - For use with Model 155D
Electron Microscopy Sciences Cross Lines Graticle NE81, 19 mm, Nominal line width 0.040 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 19 mm
Divisions: Nominal line width 0.040 mm
Surface: Chrome image
Electron Microscopy Sciences Low Magnification SEM Test Specimen Tin On Carbon, JEOL Stub
This low magnification test has a size range of 1 - 10μm for table-top SEM. Has a magnification range of 250-5,000x. Can be used on FESEM and FIB as well.
Type: JEOL Stub
Electron Microscopy Sciences Veco Hexagonal 200 mesh Copper Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter, 0.8 mil thickness.
Grid: Copper
Electron Microscopy Sciences JEOL JSM 840 SEM Cylinder Mount 1/2" surface, 1/4" height, Carbon
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from spectroscopically pure carbon.
Head: 1/2"
Height: 1/4"
Electron Microscopy Sciences Single Cross Line Reticle RET 42, 19 mm, 9 µm Line width
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Line width: 9 µm
Electron Microscopy Sciences Metallurgical Graticle G54, 21mm, ASTM 24
Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. ASTM 24 point circular grid, glass sandwich.
Size: 21mm
Method: ASTM 24
Surface: Glass sandwich